Research progress in indium tin oxide resistive thin film strain gauges

CHENG Xueying, CAO Lili, LUO Bingwei

Journal of Materials Engineering ›› 2026, Vol. 54 ›› Issue (2) : 161-173.

PDF(4413 KB)
PDF(4413 KB)
Journal of Materials Engineering ›› 2026, Vol. 54 ›› Issue (2) : 161-173. DOI: 10.11868/j.issn.1001-4381.2025.000099
REVIEW

Research progress in indium tin oxide resistive thin film strain gauges

    {{javascript:window.custom_author_en_index=0;}}
  • {{article.zuoZhe_EN}}
Author information +
History +

HeighLight

{{article.keyPoints_en}}

Abstract

{{article.zhaiyao_en}}

Key words

QR code of this article

Cite this article

Download Citations
{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2026, 54(2): 161-173 https://doi.org/10.11868/j.issn.1001-4381.2025.000099

References

References

{{article.reference}}

Funding

RIGHTS & PERMISSIONS

{{article.copyrightStatement_en}}
{{article.copyrightLicense_en}}
PDF(4413 KB)

Accesses

Citation

Detail

Sections
Recommended

/