Determination for the Yield Strength of Matrix in a SiCw/Al Composite by the X-ray Diffraction

Determination for the Yield Strength of Matrix in a SiC_w/Al Composite by the X-ray Diffraction

JIANG Chuan-hai, WANG De-zun, WU Jian-sheng

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Journal of Materials Engineering ›› 2001, Vol. 0 ›› Issue (4) : 44-47.

Determination for the Yield Strength of Matrix in a SiC_w/Al Composite by the X-ray Diffraction

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2001, 0(4): 44-47

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