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材料工程  2018, Vol. 46 Issue (8): 36-42    DOI: 10.11868/j.issn.1001-4381.2017.001003
  研究论文 本期目录 | 过刊浏览 | 高级检索 |
Co掺杂对CaBi2Nb2O9陶瓷结构和电学性能的影响
邢星河, 曹峰, 彭志航, 曾祥雄
国防科技大学 新型陶瓷纤维及其复合材料重点实验室, 长沙 410073
Effect of Co Doping on the Structural and Electrical Properties of CaBi2Nb2O9 Ceramics
XING Xing-he, CAO Feng, PENG Zhi-hang, ZENG Xiang-xiong
Science and Technology on Advanced Ceramic Fibers and Composites Laboratory, National University of Defense Technology, Changsha 410073, China
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摘要 采用传统固相反应法制备CaBi2Nb2-xCoxO9(CBNCo)陶瓷,研究Co掺杂对其微观结构、介电、压电以及电导性质的影响。结果表明:Co掺杂的CBN陶瓷为正交晶系结构,其中,CaBi2Nb1.95Co0.05O9陶瓷有杂相生成。所有CBNCo陶瓷均有较高致密性,烧结效果较好。Co的加入使CBN陶瓷烧结密度明显提高,压电性能得到改善;加入Co改性后,CBN陶瓷介电损耗均明显降低,居里温度略微增加。同时,Co的加入引入了更多缺陷,使导电机理有所改变。
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邢星河
曹峰
彭志航
曾祥雄
关键词 掺杂压电性能介电性能直流电阻缺陷    
Abstract:CaBi2Nb2-xCoxO9 ceramics were prepared by a solid-state reaction method. The effect of Co doping on their piezoelectric, dielectric and conductive properties was studied. The results show that the structure of Co doped CBN ceramics is the orthorhombic symmetry and CaBi2Nb1.95Co0.05O9 ceramics are found with impurity phase. All of the CBNCo ceramics have compact structures and are in good sinter condition. The density and the piezoelectric activity of CBN ceramics are obviously improved with Co doping contents. Co dopant greatly decreases the dielectric loss values and slightly increases the Curie-temperature of CBN ceramics. Meanwhile, the introduction of Co dopant increases the number of defects and thus changes the conductive mechanism.
Key wordsdoping    piezoelectric property    dielectric property    DC resistivity    defect
收稿日期: 2017-08-07      出版日期: 2018-08-17
中图分类号:  TM282  
通讯作者: 彭志航(1987-),男,讲师,博士,主要研究方向为铋层状压电陶瓷,联系地址:湖南省长沙市开福区德雅路253号国防科技大学新型陶瓷纤维及其复合材料重点实验室(410073),E-mail:231185939@qq.com     E-mail: 231185939@qq.com
引用本文:   
邢星河, 曹峰, 彭志航, 曾祥雄. Co掺杂对CaBi2Nb2O9陶瓷结构和电学性能的影响[J]. 材料工程, 2018, 46(8): 36-42.
XING Xing-he, CAO Feng, PENG Zhi-hang, ZENG Xiang-xiong. Effect of Co Doping on the Structural and Electrical Properties of CaBi2Nb2O9 Ceramics. Journal of Materials Engineering, 2018, 46(8): 36-42.
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http://jme.biam.ac.cn/CN/10.11868/j.issn.1001-4381.2017.001003      或      http://jme.biam.ac.cn/CN/Y2018/V46/I8/36
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