湿热贮存环境下电子器件表面镀层的腐蚀研究

刘慧丛, 邢阳, 李卫平, 朱立群

材料工程 ›› 2010, Vol. 0 ›› Issue (2) : 58-63.

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PDF(710 KB)
材料工程 ›› 2010, Vol. 0 ›› Issue (2) : 58-63.
表面工程

湿热贮存环境下电子器件表面镀层的腐蚀研究

  • 刘慧丛, 邢阳, 李卫平, 朱立群
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Corrosion on Surface Coating of Electronic Devices in Hygrothermal Environment

  • LIU Huicong, XING Yang, LI Weiping, ZHU Liqun
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文章历史 +

摘要

针对电子设备中器件在贮存环境下由于温度、湿度的变化引发的腐蚀问题,对引脚镀覆Ni/Pd/Au镀层的电子器件进行湿热试验,考察了贮存环境中的温度、相对湿度以及器件表面状态包括黏附盐分、表面划伤、黏附灰尘等因素对器件引脚表面镀层腐蚀的影响;用扫描电镜和能谱仪等研究了带Ni/Pd/Au镀层的电子器件在湿热环境下的腐蚀行为。结果表明:器件引脚表面存在三个腐蚀敏感区,分别是切边造成的基体暴露处、弯曲成形时形成的镀层裂纹处以及镀层表面的针孔处;温度和相对湿度对腐蚀有较大影响,当环境温度超过40℃,相对湿度超过80%后器件引脚镀层腐蚀加速;盐分和灰尘能够明显促进器件引脚镀层的腐蚀,有盐分和灰尘附着的表面,环境相对湿度在30%就能发生腐蚀。

Abstract

In view of the corrosion problem of electronic devices in storage environment,electronic devices with Ni/Pd/Au coatings were investigated through humid temperature test.Simultaneously,the influence of temperature,relative humidity,and surface conditions including salts,additional lead scratches and dust on the corrosion of surface coating was evaluated.Scanning electron microscopy(SEM) and Energy dispersive spectroscopy(EDS) were used to study the corrosion behaviors of the electronic devices in hygrothermal environment.The results showed that there were three corrosion susceptible locations on the surface of component leads,namely exposed base metal from trimming,cracks due to forming,and porosity on the coating surface.Temperature and relative humidity(RH) greatly affected the corrosion of electronic device.Corrosion rate was accelerated when the temperature was higher than 40℃ and the relative humidity was higher than 80%.Salt and dust on the surface also have obviously accelerated impacts on the corrosion.Component surface with salt and dust could be eroded even at 30% relative humidity.

关键词

腐蚀 / 镀层 / 电子器件 / 湿热环境

Key words

corrosion / coating / electronic device / hygrothermal environment

引用本文

导出引用
刘慧丛, 邢阳, 李卫平, 朱立群. 湿热贮存环境下电子器件表面镀层的腐蚀研究[J]. 材料工程, 2010, 0(2): 58-63
LIU Huicong, XING Yang, LI Weiping, ZHU Liqun. Corrosion on Surface Coating of Electronic Devices in Hygrothermal Environment[J]. Journal of Materials Engineering, 2010, 0(2): 58-63
中图分类号: TN406   

参考文献

[1] 陆启凯,冯皓.我国应重视工业产品环境适应性及环境失效的研究[J].新材料产业,2008,(5):10-15.
[2] 李青.电子材料的腐蚀[J].电子元件与材料,1996,15(6):48-50.
[3] 朱立群,杜岩滨,李卫平,等.手机PCB镀金接插件腐蚀失效实例分析[J].电子产品可靠性与环境试验,2006,(4):4-8.
[4] 朱立群.陶瓷材料的腐蚀[J].兵器材料科学与工程,1995,18(4):50-54.
[5] 石川雄一.电子设备器件の腐蚀试验と环境评价ぉょびその防护对策[J].ナノフレ―ティング,2008,6(26):1-8.
[6] 尾崎敏範.各种器件镀层の腐蚀防护[J].ナノフレ―ティング,2008,6(26):9-18.
[7] 石川雄一.电子产品にぉける最近数年の防护技术[J].ナノフレ―ティング,2007,4(25):19-27.
[8] 杜迎,管光宝.集成电路抗腐蚀能力的研究[J].电子产品可靠性与环境试验,2005,(4):30-33.
[9] ZHAO P,PECHT M.Mixed flowing gas studies of creep corrosion on plastic encapsulated microcircuit packages with noble metal pre-plated leadframes[J].IEEE Transactions on Device and Materials Reliability,2005,5(2):268-276.
[10] PINSKY D,OSTERMAN M,GANESAN S.Tin whiskering risk factors[J].IEEE Trans Compon package Technol,2004,27(2):427-431.
[11] ABBOTT D C.Nickel/palladium finish for leadframes[J].IEEE Trans Compon Packag Technol,1999,22(1):99-103.
[12] XIE Jing-song,SUN Ming,PECHT Michael,et al.Why gold flash can be detrimental to long-term reliability[J].Journal of Electronic Packaging,2004,126:37-40.

基金

中国航天科技集团公司航天科技创新基金资助项目(CASC0504)
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