Application of synchrotron radiation X-ray diffraction technology in residual stress analysis

Jun LUO, Nan LI, Xi WANG, Changkui LIU

Journal of Materials Engineering ›› 2024, Vol. 52 ›› Issue (7) : 120-129.

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Journal of Materials Engineering ›› 2024, Vol. 52 ›› Issue (7) : 120-129. DOI: 10.11868/j.issn.1001-4381.2023.000752

Application of synchrotron radiation X-ray diffraction technology in residual stress analysis

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2024, 52(7): 120-129 https://doi.org/10.11868/j.issn.1001-4381.2023.000752

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