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2222材料工程  2020, Vol. 48 Issue (7): 81-92    DOI: 10.11868/j.issn.1001-4381.2018.001298
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柔性阻变存储器材料研究进展
唐大秀1,2,3, 刘金云2,3, 王玉欣1,2,3, 尚杰2,3,*(), 刘钢2,3, 刘宜伟2,3, 张辉1, 陈清明1, 刘翔1,*(), 李润伟2,3,*()
1 昆明理工大学 材料科学与工程学院, 昆明 650093
2 中国科学院 宁波材料技术与工程研究所 中国科学院磁性材料与器件重点实验室, 宁波 315201
3 中国科学院 宁波材料技术与工程研究所 浙江省磁性材料及其应用技术重点实验室, 宁波 315201
Research progress in flexible resistive random access memory materials
Da-xiu TANG1,2,3, Jin-yun LIU2,3, Yu-xin WANG1,2,3, Jie SHANG2,3,*(), Gang LIU2,3, Yi-wei LIU2,3, Hui ZHANG1, Qing-ming CHEN1, Xiang LIU1,*(), Run-wei LI2,3,*()
1 School of Materials Science and Engineering, Kunming University of Science and Technology, Kunming 650093, China
2 CAS Key Laboratory of Magnetic Materials and Devices, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo 315201, China
3 Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo 315201, China
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摘要 

本文简述了阻变存储器的基本结构、工作原理、发展历程和研究现状,归纳总结了柔性阻变存储器的材料体系,包括介质材料、电极材料和基底材料,以及柔性阻变存储器材料体系的总体趋势和最新研究进展;分析了柔性阻变存储器的性能特点,包括存储性能和力学性能。阐述了发展柔性阻变存储器的重要意义与面临的挑战,提出了该领域现在研究中存在的不足和未来需要进一步研究的方向。得出力学性能稳定的高电导可拉伸电极和存储性能稳定的可拉伸介质是柔性阻变存储器材料今后发展的主要方向。

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唐大秀
刘金云
王玉欣
尚杰
刘钢
刘宜伟
张辉
陈清明
刘翔
李润伟
关键词 柔性阻变存储器介质材料电极材料基底材料存储性能力学性能    
Abstract

The basic structure, working principle, and the development process and research status of resistive random access memory (RRAM) were outlined. Material systems, including dielectric materials, electrode materials, and substrate materials, as well as broad trends and recent researches of flexible RRAM were summarized; the performance characteristics of flexible RRAM, including storage performance and mechanics performance, were analyzed. The significance and challenge of developing flexible RRAM were explicated. Problems existing in this area and possible approaches to the problems were also put forward. It was concluded that the highly conductive stretchable electrode and the steadily stored stretchable dielectric are primary direction in the future.

Key wordsflexible resistive random access memory    dielectric material    electrode material    substrate material    storage performance    mechanics performance
收稿日期: 2018-11-06      出版日期: 2020-07-21
中图分类号:  TB34  
基金资助:国家自然科学基金资助项目(61774161);国家自然科学基金资助项目(61574146);国家重点研发计划项目(2016YFE0126700);浙江省公益性技术应用研究计划项目(2017C31100);宁波市"科技创新2025"重大专项(2018B10057)
通讯作者: 尚杰,刘翔,李润伟     E-mail: shangjie@nimte.ac.cn;lxjim@126.com;runweili@nimte.ac.cn
作者简介: 李润伟(1974-), 男, 研究员, 博士, 主要从事可用于新型存储和传感的磁电功能材料探索及原型器件设计, 联系地址:浙江省宁波市镇海区中官西路1219号(315201), E-mail:runweili@nimte.ac.cn
刘翔(1973-), 男, 教授, 博士, 主要从事光电功能陶瓷、薄膜材料及器件研究, 联系地址:云南省昆明市一二一大街文昌路68号(650093), E-mail:lxjim@126.com
尚杰(1979-), 男, 研究员, 博士, 主要从事柔性/可拉伸阻变存储器和应力传感器材料与器件研究, 联系地址:浙江省宁波市镇海区中官西路1219号(315201), E-mail:shangjie@nimte.ac.cn
引用本文:   
唐大秀, 刘金云, 王玉欣, 尚杰, 刘钢, 刘宜伟, 张辉, 陈清明, 刘翔, 李润伟. 柔性阻变存储器材料研究进展[J]. 材料工程, 2020, 48(7): 81-92.
Da-xiu TANG, Jin-yun LIU, Yu-xin WANG, Jie SHANG, Gang LIU, Yi-wei LIU, Hui ZHANG, Qing-ming CHEN, Xiang LIU, Run-wei LI. Research progress in flexible resistive random access memory materials. Journal of Materials Engineering, 2020, 48(7): 81-92.
链接本文:  
http://jme.biam.ac.cn/CN/10.11868/j.issn.1001-4381.2018.001298      或      http://jme.biam.ac.cn/CN/Y2020/V48/I7/81
Fig.1  阻变存储器[2] (a)存储单元示意图;(b)高阻态和低阻态可逆转换
Fig.2  基于氧化锌介质材料[4](a)及氧化石墨烯介质材料的柔性阻变存储器[8](b)1-典型I-V曲线;2-高低阻态循环测试;3-高低阻态与弯曲半径的关系
Fig.3  基于氧化铝/硫化镉[13](a)及聚苯乙烯/碳纳米管复合介质材料(b)的柔性阻变存储器[15]1-典型I-V曲线; 2-高低阻态循环测试; 3-弯曲循环测试
Fig.4  基于pEGDMA[16](a)及pV3D3(b)介质材料的柔性阻变存储器[17] 1-典型I-V曲线(插图为器件的TEM截面图);2-高低阻态循环测试与保持时间;3-高低阻态与弯曲半径的关系
Fig.5  基于MOF介质材料的Au/HKUST-1/Au/PET器件的存储性能[18] (a)电流-电压特性;(b)高低组态随着弯曲半径或应变的演变; (c)阈值电压(置位电压和复位电压)随着弯曲半径或应变的演变
Fig.6  柔性阻变随机存储器材料的发展[4-79] (a)介质材料;(b)电极材料;(c)基底材料
Fig.7  基于不同电极材料的柔性阻变存储器的力学性能[24](a)ITO/HfOx/ITO/PET器件阈值电压随弯折半径的演变;(b)ITO/HfOx/Pt/PET器件阈值电压和高低阻态随弯折半径的演变
Fig.8  基于不同基底的柔性RRAM器件[5, 8, 10, 20, 34-35, 47, 50, 52-53, 68] (a)PES基底[5, 8, 10, 47];(b)PI基底[20, 35, 47, 50];(c)PET基底[34, 52-53, 68]
Fig.9  1S-1R结构的柔性十字交叉RRAM存储阵列[28]
Fig.10  柔性阻变存储器失效的原因[24] (a)ITO/HfOx/ITO器件裂纹形成的示意图以及RRAM器件的等效电路;(b)高低组态与弯曲半径的关系
Fig.11  基于预拉伸基底的柔性可拉伸阻变存储器[70-72] (a)Al/P3BT:PMMA/graphene/PDMS可拉伸阻变存储器的制备过程和电流-电压特性;(b)Al/PF14-b-Pison/CNTs/PDMS可拉伸阻变存储器的结构和电流-电压特性;(c)Al/MH-b-PI/CNTs/PDMS可拉伸阻变存储器的结构和电流-电压特性
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