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材料工程  2020, Vol. 48 Issue (8): 169-176    DOI: 10.11868/j.issn.1001-4381.2019.000286
  研究论文 本期目录 | 过刊浏览 | 高级检索 |
薄壁结构工业CT尺寸测量误差与极限
陈子木1,2,3, 胡正伟1,2,3, 王倩妮1,2,3, 史亦韦1,2,3
1. 中国航发北京航空材料研究院, 北京 100095;
2. 航空材料检测与评价北京市重点实验室, 北京 100095;
3. 中国航空发动机集团材料检测与评价重点实验室, 北京 100095
Error and limit determination for dimensional measurements of thin-walled structures with industrial computed tomography
CHEN Zi-mu1,2,3, HU Zheng-wei1,2,3, WANG Qian-ni1,2,3, SHI Yi-wei1,2,3
1. AECC Beijing Institute of Aeronautical Materials, Beijing 100095, China;
2. Beijing Key Laboratory of Aeronautical Materials Testing and Evaluation, Beijing 100095, China;
3. Key Laboratory of Aeronautical Materials Testing and Evaluation, Aero Engine Corporation of China, Beijing 100095, China
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摘要 针对增材制造复杂构件中薄壁结构的高精度尺寸测量需求,推导了薄壁结构经工业CT系统成像后的图像灰度分布函数及边界位置特征,并对比分析了半高宽法和最大灰度梯度法的适用范围,计算了基于CT成像的尺寸测量极限。通过对校准尺寸的薄壁结构进行工业CT扫描成像实验,测量不同厚度薄壁结构的壁厚尺寸。结果表明:对于尺寸大于CT成像系统可测壁厚尺寸极限的薄壁结构,半高宽法相比最大灰度梯度法测量误差更小。薄壁结构尺寸测量极限可通过实验测量CT成像系统的边扩散函数后利用计算模拟的方法获得。
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陈子木
胡正伟
王倩妮
史亦韦
关键词 薄壁结构工业CT尺寸测量测量极限    
Abstract:Due to the high-accuracy requirement of dimensional measurements for thin-walled structures of additive manufacturing products, the grayscale distribution of the industrial CT image and the location of the structural boundaries in the image space were derived. In addition, the validity of the half-height-width method and the maximum gradient method was compared and analyzed, and the limit of the dimensional measurement based on CT imaging was calculated. The thin-walled structures with different thicknesses were calibrated, and measured by industrial CT scanning and imaging experiment. The results show that the half-height-width method generates a smaller error compared with the maximum gradient method, when the thickness of the thin-walled structures is larger than the measurement limit of the CT system. Finally, the measurement limit can be obtained by numerical simulations based on the edge spread function with experimental measurements.
Key wordsthin-walled structure    industrial computed tomography    dimensional measurement    mea-surement limit
收稿日期: 2019-03-27      出版日期: 2020-08-15
中图分类号:  TG115.28  
通讯作者: 陈子木(1985-),男,工程师,博士,研究方向为工业CT检测,联系地址:北京市81信箱6分箱(100095),E-mail:chenzimu1221@163.com     E-mail: chenzimu1221@163.com
引用本文:   
陈子木, 胡正伟, 王倩妮, 史亦韦. 薄壁结构工业CT尺寸测量误差与极限[J]. 材料工程, 2020, 48(8): 169-176.
CHEN Zi-mu, HU Zheng-wei, WANG Qian-ni, SHI Yi-wei. Error and limit determination for dimensional measurements of thin-walled structures with industrial computed tomography. Journal of Materials Engineering, 2020, 48(8): 169-176.
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http://jme.biam.ac.cn/CN/10.11868/j.issn.1001-4381.2019.000286      或      http://jme.biam.ac.cn/CN/Y2020/V48/I8/169
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