SrBi2Ta2O9铁电薄膜的结构与性能研究进展

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材料工程 ›› 2001, Vol. 0 ›› Issue (8) : 44-47.

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综述

SrBi₂Ta₂O₉铁电薄膜的结构与性能研究进展

王文, 周玉, 叶枫, 贾德昌, 宋桂明, 雷廷权

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Progress in the Structure and Properties of Ferroelectric SrBi₂Ta₂O₉ Thin Films

WANG Wen, ZHOU Yu, YE Feng, JIA De-chang, SONG Gui-ming, LEI Ting-quan

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摘要

综述了SrBi₂Ta₂O₉的结构和性能研究进展,着重阐明化学组成、结晶取向、热处理条件、使用温度对SrBi₂Ta₂O₉铁电性能的影响.结果表明,以Bi₄Ti₃O₁₂作为过渡层,采用快速热处理法,Sr:Bi:Ta=0.8:2.2:2时,有助于提高SBT薄膜的剩余极化值,降低矫顽场强和电流漏损.

Abstract

The progress in the structure and properties of ferroelectric SrBi₂Ta₂O₉ thin films was reviewed. Special attention was focused on the effect of the chemical composition, crystal orientation, annealing conditions and service temperature on SrBi₂Ta₂O₉ ferroelectric properties. The results show that the SBT thin film with Sr:Bi:Ta=0.8:2.2:2 on the Bi₄Ti₃O₁₂ buffer, prepared by a rapid thermal annealing, possesses the high remanent polarization, the low coercive filed and the low loss current.

导出引用

王文, 周玉, 叶枫, 贾德昌, 宋桂明, 雷廷权. SrBi₂Ta₂O₉铁电薄膜的结构与性能研究进展[J]. 材料工程, 2001, 0(8): 44-47

WANG Wen, ZHOU Yu, YE Feng, JIA De-chang, SONG Gui-ming, LEI Ting-quan. Progress in the Structure and Properties of Ferroelectric SrBi₂Ta₂O₉ Thin Films[J]. Journal of Materials Engineering, 2001, 0(8): 44-47

中图分类号： TM220

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